We’re excited to announce that Dermpath Diagnostics New York’s full-service laboratory has moved into a new, cutting-edge facility in White Plains. Our new location will allow us to advance our best-in-class dermatopathology services, including accurate, timely diagnoses and exceptional customer service. We’ve invested in standardizing and optimizing our workflow for even greater efficiency and expeditious diagnoses.
New home, same renowned expertise
Our New York team of dermatopathologists will join us at our new facility to continue delivering diagnostic excellence driven by unmatched expertise. Among them are Dr Adnan Mir, who is one of the few pediatric dermatologists/dermatopathologists in the world, as well as Dr Edward Heilman, who serves as a senior consultant while being Chairman of the Department of Dermatology at Downstate Medical Center.
Accurate, timely diagnoses
We’ve streamlined our operations for faster results and timely diagnoses. We will continue to offer our comprehensive test menu, including clinical and advanced testing from our partners Quest Diagnostics® and Quest Diagnostics Nichols Institute:
- Histopathologic evaluation by H&E stains
- Special stains (group 1 & 2)
- Immunoperoxidase stains
- BRAF testing for patients diagnosed with metastatic melanoma
- Dermatologic disease-state monitoring
A personalized, collaborative approach
Our dermatopathologists take a personalized approach to each case, with all team members available for consultation on any patient’s specimens. We understand that every specimen that comes through our door represents a unique life, and track them from receipt through result delivery using our ASSIST tracking system. This personalized service, attention to detail, and a true sense of caring from our dermatopathologists and client support staff contribute to our record of providing unparalleled excellence in diagnostic testing.
Meet our renowned team
Each of our dermatopathologists is board-certified in dermatopathology and either dermatology or anatomic pathology.
